low-noise precision operational amplifier op27 asd0012330 rev. h information furnished by analog devices is believed to be accurate and reliable. however, no responsibility is assumed by analog devices for its use, nor for any infringements of patents or other rights of third parties that may result from its use. specifications subject to change without notice. no license is granted by implication or otherwise under any patent or patent rights of analog devices. trademarks and registered trademarks are the property of their respective companies. one technology way, p.o. box 9106, norwood, ma 02062-9106, u.s.a. tel: 781.329.4700 www.analog.com fax: 781.326.8703 ? 2009 analog devices, inc. all rights reserved. 1.0 scope this specification documents the detailed requirements for analog devices space qualified die including die qualification as described for class k in mil-prf-38534, appendix c, table c-ii except as modified herein. the manufacturing flow described in the standard die products program brochure at http://www.analog.com/aerospace is to be considered a pa rt of this specification. this data sheet specifically details the space grade version of this product. a more detailed operational description and a complete data shee t for commercial product grades can be found at www.analog.com/op27 2.0 part number . the complete part number(s) of this specification follow: part number description op27-000c low-noise precision operational amplifier OP27R000C radiation tested low-noise precision operational amplifier 3.0 die information 3.1 die dimensions die size die thickness bond pad metalization 66 mil x 95 mil 19 mil 2 mil al/cu 3.2 die picture 1. balance 2. -input 3. +input 4. -v s 5. nc 6. out 7. +v s 8. balance
op27 asd0012330 rev. h | page 2 of 6 3.3 absolute maximum ratings 1/ supply voltage (v s ) ....................................................... 22v input voltage 2/ ................................................................ 22v output short circuit duration .......................................... indefinite differential input voltage 3/ .............................................. 0.7v differential input current 3/ .............................................. 25ma storage temperature range ............................................. -65 c to +150 c operating temperature range............................................ -55 c to +125 c junction temperature (t j )????????????... 150c absolute maximum ratings notes 1/ stresses above the absolute maximum rating may cause permanent damage to the device. extended operation at the maximum levels may degrade performance and affect reliability. 2/ for supply voltages less than 22v, the abso lute maximum input vol tage is equal to the supply voltages. 3/ the device inputs are protected by back-to-b ack diodes. current limiting resistors are not used in order to achieve low noise. if differential input voltage exceeds 0.7v, the input current should be limited to 25ma. 4.0 die qualification in accordance with class-k version of mil-prf-38534, appendix c, table c-ii, except as modified herein. (a) qual sample size and qual acceptance criteria ? 10/0 (b) qual sample package ? dip (c) pre-screen electrical test over temper ature performed post-assembly prior to die qualification.
op27 asd0012330 rev. h | page 3 of 6 table i - dice electrical characteristics parameter symbol conditions 1/ limit min limit max units input offset voltage v os -25 25 v input offset current i os -35 +35 na average input bias current i ib -40 +40 na input voltage range ivr 11 v power supply rejection ratio psrr v s = 4.5v to 18v 10 v/v r l 2k ? 12 output voltage swing v out r l 600 ? 10 v supply current i s no load 4.67 ma power dissipation p d no load 140 mw +i sc +70 output short-circuit current -i sc -70 ma slew rate sr v out = 5v, r l 2k ? , c l = 100pf, measured at -2.5v to +2.5v 1.7 v/ s gain bandwidth gbw 5 mhz common mode rejection ratio cmrr v cm = ivr = 11v 114 db large signal voltage gain a vo v out = 10v, r l 2k ? 1000 v/mv table i notes: 1/ v s = 15v, t a = 25 c, unless otherwise specified.
op27 asd0012330 rev. h | page 4 of 6 table ii - electrical characterist ics for qual samples parameter symbol conditions 1/ sub- groups limit min limit max units 4 -25 25 5, 6 -60 60 input offset voltage v os m, d, l, r 3 / 4 -100 100 v average input offset voltage 2 / tcv os 5, 6 -0.6 0.6 v/c 1 -35 +35 2, 3 -50 +50 input offset current i os m, d, l, r 3 / 1 -100 100 1 -40 +40 2, 3 -60 +60 average input bias current i ib m, d, l, r 3 / 1 -1000 1000 na 1 11 input voltage range 2 / ivr 2, 3 10.3 v 1 10 power supply rejection ratio 2 / psrr v s = 4.5v to 18v 2, 3 16 v/v r l 2k ? 12 r l 600 ? 1 10 output voltage swing 2 / v out r l 2k ? 2, 3 11.5 v no load 1 4.67 supply current i s m, d, l, r 3 / 1 4.7 ma power dissipation 2 / p d no load 1 140 mw +i sc +70 output short-circuit current 2 / -i sc 1 -70 ma slew rate 2 / sr v out = 5v, r l 2k ? , c l = 100pf, measured at -2.5v to +2.5v 4 1.7 v/ s gain bandwidth 2 / gbw 4 5 mhz v cm = ivr = 11v 4 114 common mode rejection ratio 2 / cmrr v cm = ivr = 10.3v 5, 6 108 db 4 1000 v out = 10v, r l 2k ? 5, 6 600 large signal voltage gain a vo m, d, l, r 3 / 4 100 v/mv table ii notes: 1/ v s = 15v, r s = 50 ? , unless otherwise specified. 2/ this parameter not tested post irradiation. 3/ devices tested at 100krad irradiation.
op27 asd0012330 rev. h | page 5 of 6 table iii - life test endpoint and delta parameter (product is tested in acco rdance with table ii with the following exceptions) post burn in limit post life test limit parameter symbol sub- groups min max min max life test delta units 4 -60 60 -135 135 75 input offset voltage v os 5, 6 -170 170 v 1 -55 55 -65 65 10 input bias current i ib 2, 3 -85 85 na 5.0 life test/burn-in information 5.1 htrb is not applicable for this drawing. 5.2 burn-in is per mil-std-883 method 1015 test condition b or c. 5.3 steady state life test is per mil-std-883 method 1005.
op27 asd0012330 rev. h | page 6 of 6 rev description of change date a initiate 5-jun-091 b delete post burn-in temp limit from table iii; add document number and absolute max ratings 265-jun-091 c delete vos adjust from table i and ii, delete 600ohm gain, change psrr range from 4v to 18v to 4.5v to 18v. update web address. 20-dec-01 d update web address aug. 5, 2003 e add radiation limits and part number for rad guarantee. sept. 30, 2003 f update header/footer and add to 1.0 scope description. feb. 26, 2008 g add junction temperature(tj)?150c to 3.3 absolute max ratings march 27, 2008 h updated section 4.0c note to indicat ed pre-screen temp testing being performed. june 6, 2009 ? 2009 analog devices, inc. all rights reserved. trademarks and registered trademarks are the property of their respective companies. printed in the u.s.a. 06/09
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